sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
New York, N.Y. : Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers, c1983
図書等| No. | 所在 | 請求記号 | 資料ID | 資料タイプ | 状況（返却予定日） | コレクション | 備考 | 予約・取り寄せ人数 |
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1 |
549.04-A49-21
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10008025248 |
一般図書 |
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1983
viii, 356 p. : ill., ports. ; 28 cm
Reliability Physics, 21st annual proceedings 1983
"1983 International Reliability Physics Symposium"--T.p. verso
General chairman: D.L. Burgess
"IEEE catalog no. 83CH1846-5."
"Library of Congress Catalog Card no. 82-640313."
"A bonus publication from your Reliability Society"--Cover
Includes bibliographical references
アメリカ合衆国
英語 (eng)
英語 (eng)
International Reliability Physics Symposium [ IRPS ] [ I.R.P.S ] [ Reliability Physics Symposium, International ] [ IEEE International Reliability Physics Symposium ] [ Reliability Physics Symposium ]
IEEE Electron Devices Society [ Institute of Electrical and Electronics Engineers. Electron Devices Society ] [ I.E.E.E. Electron Devices Society ] [ IEEE Electron Device Society ] [ Institute of Electrical and Electronics Engineers. Electron Devices Group ] [ IEEE Group on Electron Devices ]
IEEE Reliability Society [ Institute of Electrical and Electronics Engineers. Reliability Society ] [ I.E.E.E. Reliability Society ] [ IEEE Reliability Group ]
Electronic apparatus and appliances -- Reliability Congresses
Electronic apparatus and appliances -- Testing Congresses
BA6596431X
