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Please use this identifier to cite or link to this item: http://hdl.handle.net/2241/100737

Title: Energy spectra of secondary electrons induced by fast ions under channeling conditions
Authors: Kudo, H.
Shima, K.
Seki, S.
Takita, K.
Masuda, K.
Murakami, K.
Ippshi, T.
工藤, 博
村上, 浩一
Issue Date: Jul-1988
Publisher: American Physical Society
Journal Title: Physical review B
Volume: 38
Issue: 1
Start Page: 44
End Page: 49
DOI: 10.1103/PhysRevB.38.44
PMID: 9945162
Abstract: We have studied simple aspects of the energy spectra of ion-induced secondary electrons emitted from single crystals under channeling conditions. The energy spectra for Si and GaAs targets, measured at a backward angle of 180° for various incident ions over a 2–8 MeV/amu energy range, showed a constant decrease in the electron yield over certain keV energy regions when channeling occurred. This behavior was interpreted as a decrease in the effective target thickness, resulting from the ion-beam shadowing effect near crystal surfaces.
URI: http://hdl.handle.net/2241/100737
Rights: ©1988 The American Physical Society
Text Version: publisher
Appears in Collections:Physical review B
工藤 博 (Kudo Hiroshi)
村上 浩一 (Murakami Kouichi)

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